Automatic virtual metrology for wheel machining automation

Haw Ching Yang, Hao Tieng, Fan Tien Cheng

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Total inspection after wheel machining becomes essential for safety consideration and continuous improvement. However, conducting wheel-by-wheel actual metrology is very expensive and time-consuming. A novel idea is to use virtual metrology (VM) that predicts wheel quality based on process data collected from machine tool with a slight supplement of actual metrology data. The technology of automatic virtual metrology (AVM) has been proposed by the authors and successfully deployed in hi-tech industries, such as semiconductor, display and solar cell. The purpose of this study was to propose an approach to apply the AVM system factory-wide to wheel machining automation (WMA) for achieving total inspection of all the precision items of WMA under mass production environment.

Original languageEnglish
Pages (from-to)6367-6377
Number of pages11
JournalInternational Journal of Production Research
Volume54
Issue number21
DOIs
Publication statusPublished - 2016 Nov 1

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All Science Journal Classification (ASJC) codes

  • Strategy and Management
  • Management Science and Operations Research
  • Industrial and Manufacturing Engineering

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