Automatic virtual metrology for wheel machining automation

Total inspection after wheel machining becomes essential for safety consideration and continuous improvement. However, conducting wheel-by-wheel actual metrology is very expensive and time-consuming. A novel idea is to use virtual metrology (VM) that predicts wheel quality based on process data collected from machine tool with a slight supplement of actual metrology data. The technology of automatic virtual metrology (AVM) has been proposed by the authors and successfully deployed in hi-tech industries, such as semiconductor, display and solar cell. The purpose of this study was to propose an approach to apply the AVM system factory-wide to wheel machining automation (WMA) for achieving total inspection of all the precision items of WMA under mass production environment.