Autonomous Testing for 3D-ICs with IEEE Std. 1687

Jin Cun Ye, Michael A. Kochte, Kuen Jong Lee, Hans Joachim Wunderlich

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)


IEEE Std. 1687, or IJTAG, defines flexible serial scan-based architectures for accessing embedded instruments efficiently. In this paper, we present a novel test architecture that employs IEEE Std. 1687 together with an efficient test controller to carry out 3D-IC testing autonomously. The test controller can deliver parallel test data for the IEEE Std. 1687 structures and the cores under test, and provide required control signals to control the whole test procedure. This design can achieve at-speed, autonomous and programmable testing in 3D-ICs. Experimental results show that the additional area and test cycle overhead of this architecture is small considering its autonomous test capability.

Original languageEnglish
Title of host publicationProceedings - 2016 IEEE 25th Asian Test Symposium, ATS 2016
PublisherIEEE Computer Society
Number of pages6
ISBN (Electronic)9781509038084
Publication statusPublished - 2016 Dec 22
Event25th IEEE Asian Test Symposium, ATS 2016 - Hiroshima, Japan
Duration: 2016 Nov 212016 Nov 24

Publication series

NameProceedings of the Asian Test Symposium
ISSN (Print)1081-7735


Other25th IEEE Asian Test Symposium, ATS 2016

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering


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