Autonomous Testing for 3D-ICs with IEEE Std. 1687

Jin Cun Ye, Michael A. Kochte, Kuen Jong Lee, Hans Joachim Wunderlich

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

IEEE Std. 1687, or IJTAG, defines flexible serial scan-based architectures for accessing embedded instruments efficiently. In this paper, we present a novel test architecture that employs IEEE Std. 1687 together with an efficient test controller to carry out 3D-IC testing autonomously. The test controller can deliver parallel test data for the IEEE Std. 1687 structures and the cores under test, and provide required control signals to control the whole test procedure. This design can achieve at-speed, autonomous and programmable testing in 3D-ICs. Experimental results show that the additional area and test cycle overhead of this architecture is small considering its autonomous test capability.

Original languageEnglish
Title of host publicationProceedings - 2016 IEEE 25th Asian Test Symposium, ATS 2016
PublisherIEEE Computer Society
Pages215-220
Number of pages6
ISBN (Electronic)9781509038084
DOIs
Publication statusPublished - 2016 Dec 22
Event25th IEEE Asian Test Symposium, ATS 2016 - Hiroshima, Japan
Duration: 2016 Nov 212016 Nov 24

Publication series

NameProceedings of the Asian Test Symposium
ISSN (Print)1081-7735

Other

Other25th IEEE Asian Test Symposium, ATS 2016
CountryJapan
CityHiroshima
Period16-11-2116-11-24

Fingerprint

Controllers
Testing

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Ye, J. C., Kochte, M. A., Lee, K. J., & Wunderlich, H. J. (2016). Autonomous Testing for 3D-ICs with IEEE Std. 1687. In Proceedings - 2016 IEEE 25th Asian Test Symposium, ATS 2016 (pp. 215-220). [7796115] (Proceedings of the Asian Test Symposium). IEEE Computer Society. https://doi.org/10.1109/ATS.2016.56
Ye, Jin Cun ; Kochte, Michael A. ; Lee, Kuen Jong ; Wunderlich, Hans Joachim. / Autonomous Testing for 3D-ICs with IEEE Std. 1687. Proceedings - 2016 IEEE 25th Asian Test Symposium, ATS 2016. IEEE Computer Society, 2016. pp. 215-220 (Proceedings of the Asian Test Symposium).
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abstract = "IEEE Std. 1687, or IJTAG, defines flexible serial scan-based architectures for accessing embedded instruments efficiently. In this paper, we present a novel test architecture that employs IEEE Std. 1687 together with an efficient test controller to carry out 3D-IC testing autonomously. The test controller can deliver parallel test data for the IEEE Std. 1687 structures and the cores under test, and provide required control signals to control the whole test procedure. This design can achieve at-speed, autonomous and programmable testing in 3D-ICs. Experimental results show that the additional area and test cycle overhead of this architecture is small considering its autonomous test capability.",
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Ye, JC, Kochte, MA, Lee, KJ & Wunderlich, HJ 2016, Autonomous Testing for 3D-ICs with IEEE Std. 1687. in Proceedings - 2016 IEEE 25th Asian Test Symposium, ATS 2016., 7796115, Proceedings of the Asian Test Symposium, IEEE Computer Society, pp. 215-220, 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, 16-11-21. https://doi.org/10.1109/ATS.2016.56

Autonomous Testing for 3D-ICs with IEEE Std. 1687. / Ye, Jin Cun; Kochte, Michael A.; Lee, Kuen Jong; Wunderlich, Hans Joachim.

Proceedings - 2016 IEEE 25th Asian Test Symposium, ATS 2016. IEEE Computer Society, 2016. p. 215-220 7796115 (Proceedings of the Asian Test Symposium).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Ye JC, Kochte MA, Lee KJ, Wunderlich HJ. Autonomous Testing for 3D-ICs with IEEE Std. 1687. In Proceedings - 2016 IEEE 25th Asian Test Symposium, ATS 2016. IEEE Computer Society. 2016. p. 215-220. 7796115. (Proceedings of the Asian Test Symposium). https://doi.org/10.1109/ATS.2016.56