TY - GEN
T1 - Autonomous Testing for 3D-ICs with IEEE Std. 1687
AU - Ye, Jin Cun
AU - Kochte, Michael A.
AU - Lee, Kuen Jong
AU - Wunderlich, Hans Joachim
N1 - Publisher Copyright:
© 2016 IEEE.
Copyright:
Copyright 2017 Elsevier B.V., All rights reserved.
PY - 2016/12/22
Y1 - 2016/12/22
N2 - IEEE Std. 1687, or IJTAG, defines flexible serial scan-based architectures for accessing embedded instruments efficiently. In this paper, we present a novel test architecture that employs IEEE Std. 1687 together with an efficient test controller to carry out 3D-IC testing autonomously. The test controller can deliver parallel test data for the IEEE Std. 1687 structures and the cores under test, and provide required control signals to control the whole test procedure. This design can achieve at-speed, autonomous and programmable testing in 3D-ICs. Experimental results show that the additional area and test cycle overhead of this architecture is small considering its autonomous test capability.
AB - IEEE Std. 1687, or IJTAG, defines flexible serial scan-based architectures for accessing embedded instruments efficiently. In this paper, we present a novel test architecture that employs IEEE Std. 1687 together with an efficient test controller to carry out 3D-IC testing autonomously. The test controller can deliver parallel test data for the IEEE Std. 1687 structures and the cores under test, and provide required control signals to control the whole test procedure. This design can achieve at-speed, autonomous and programmable testing in 3D-ICs. Experimental results show that the additional area and test cycle overhead of this architecture is small considering its autonomous test capability.
UR - http://www.scopus.com/inward/record.url?scp=85010210739&partnerID=8YFLogxK
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U2 - 10.1109/ATS.2016.56
DO - 10.1109/ATS.2016.56
M3 - Conference contribution
AN - SCOPUS:85010210739
T3 - Proceedings of the Asian Test Symposium
SP - 215
EP - 220
BT - Proceedings - 2016 IEEE 25th Asian Test Symposium, ATS 2016
PB - IEEE Computer Society
T2 - 25th IEEE Asian Test Symposium, ATS 2016
Y2 - 21 November 2016 through 24 November 2016
ER -