Bad page relaxation to prolong the lifetime of flash devices

Ming Chang Yang, Yuan Hung Kuan, Yuan Hao Chang, Pei Lun Suei, ChiaHeng Tu, Norman Chang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The lifetime degradation of new multi-level cell (MLC) flash devices is becoming more and more serious due to the fast-increasing bit error rate variance among flash pages, where a flash chip consists of multiple blocks and each block consists of a fixed number of pages. Existing works usually discard bad pages in the unit of a block, but result in shortened the device lifetime due to the insufficient storage capacity. This issue is exacerbated when new MLC flash devices are adopted. In contrast to existing works, we propose a bad page relaxation scheme to ultimately extend the device lifetime by discarding bad pages in the unit of a page. The proposed scheme takes advantage of the high flexibility of page-level mapping strategies in reading/writing pages to avoid management overheads. The experiments were conducted based on representative realistic workloads to evaluate the efficacy of the proposed scheme, and the results are very encouraging.

Original languageEnglish
Title of host publication2014 IEEE 3rd Global Conference on Consumer Electronics, GCCE 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages715-716
Number of pages2
ISBN (Electronic)9781479951451
DOIs
Publication statusPublished - 2014 Feb 3
Event2014 IEEE 3rd Global Conference on Consumer Electronics, GCCE 2014 - Tokyo, Japan
Duration: 2014 Oct 72014 Oct 10

Publication series

Name2014 IEEE 3rd Global Conference on Consumer Electronics, GCCE 2014

Other

Other2014 IEEE 3rd Global Conference on Consumer Electronics, GCCE 2014
CountryJapan
CityTokyo
Period14-10-0714-10-10

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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