BASELINE PREDICTIVE MAINTENANCE METHOD FOR TARGET DEVICE AND COMPUTER PROGRAM PRODUCT THEREOF

Fan-Tien Cheng (Inventor), Chrong-Reen Wang (Inventor)

Research output: Patent

Abstract

A baseline predictive maintenance method for a target device (TD) and a computer program product thereof are provided. Fresh samples which are generated when the target device produces workpieces just after maintenance are collected, and a new workpiece sample which is generated when the target device produces a new workpiece is collected. A plurality of modeling samples are used to build a TD baseline model in accordance with a conjecturing algorithm, wherein the modeling samples include the new workpiece sample and the fresh samples. A TD healthy baseline value for the new workpiece is computed by the TD baseline model, and a device health index (DHI), a baseline error index (BEI) and baseline individual similarity indices (ISIB) are computed, thereby achieving the goals of fault detection and classification (FDC) and predictive maintenance (PdM).
Translated title of the contribution標的裝置的基底預測保養方法與其電腦程式產品
Original languageEnglish
Patent number10-1518448
Publication statusPublished - 1800

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