Bismuth ferrite (BiFeO3) based metal-semiconductor-metal photodetectors realized by the design of experiments approach

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this study, three different shapes (traditional, spiral, and enclosed) of interdigitated electrodes are designed and implemented on BFO photodetectors (PD). The electrode material used is indium tin oxide or ITO. As the dielectric layer, BFO is sputtered onto the silicon substrate via a radio frequency magnetron sputtering machine and annealed with a furnace tube. Eight experiments are planned according to the procedures set forth by the binary design of experiments (DOE) to optimize the PD fabrication steps. The three process parameters contemplated are annealing gases (nitrogen or oxygen), annealing temperature (300 and 550ºC), and sputtering argon flow rate (5 and 10 sccm). It can be found that regardless of the shape of interdigitated electrodes used, the responsivity and detectivity obtained from Run 3 (annealing temperature of 300ºC, argon flow of 10 sccm, and nitrogen annealing gas) are relatively large. In contrast, the corresponding values are all comparatively small in Run 5 (annealing temperature of 300ºC, argon flow of 5 sccm, and oxygen annealing gas). Furthermore, the interaction between the annealing temperature and the different annealing gases, as well as the argon flow alone, have noticeable influences on the responsivity and detectivity of the BFO photodetectors with the traditional interdigitated and spiral interdigitated electrodes. As for the PDs with the enclosed electrodes, the interaction between the annealing temperature and the different annealing gases also undeniably impacts the resultant responsivity and detectivity.

Original languageEnglish
Title of host publicationOxide-Based Materials and Devices XV
EditorsDavid J. Rogers, Ferechteh H. Teherani
PublisherSPIE
ISBN (Electronic)9781510670341
DOIs
Publication statusPublished - 2024
EventOxide-Based Materials and Devices XV 2024 - San Francisco, United States
Duration: 2024 Jan 292024 Feb 1

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12887
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOxide-Based Materials and Devices XV 2024
Country/TerritoryUnited States
CitySan Francisco
Period24-01-2924-02-01

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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