BIST and diagnosis of fully logic blocks in FPGAs

Cheng-Wen Wu, S.-K. Lu, J.-S. Shih

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication11th VLSI Design/CAD Symposium
Place of PublicationPingtung
Publication statusPublished - 2000 Aug

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