BIST scheme for DAC testing

Soon-Jyh Chang, C. L. Lee, J. E. Chen

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

A low-cost, built-in self-test (BIST) scheme for a digital-to-analogue converter (DAC) is presented. The basic idea is to convert the DAC output voltages corresponding to different input codes into different oscillation frequencies through a voltage controlled oscillator (VCO), and further transfer these frequencies to different digital codes using a counter. According to the input and output codes, performances of a DAC, such as offset error, gain error, differential nonlinearity (DNL), integral nonlinearity (INL), could be effectively detected by simply using digital circuits rather than complex analogue ones. In addition, the annoying DAC output noise could be naturally filtered out by this BIST method.

Original languageEnglish
Pages (from-to)776-777
Number of pages2
JournalElectronics Letters
Volume38
Issue number15
DOIs
Publication statusPublished - 2002 Jul 18

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Built-in self test
Digital to analog conversion
Testing
Variable frequency oscillators
Digital circuits
Electric potential
Costs

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Chang, Soon-Jyh ; Lee, C. L. ; Chen, J. E. / BIST scheme for DAC testing. In: Electronics Letters. 2002 ; Vol. 38, No. 15. pp. 776-777.
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Chang, S-J, Lee, CL & Chen, JE 2002, 'BIST scheme for DAC testing', Electronics Letters, vol. 38, no. 15, pp. 776-777. https://doi.org/10.1049/el:20020530

BIST scheme for DAC testing. / Chang, Soon-Jyh; Lee, C. L.; Chen, J. E.

In: Electronics Letters, Vol. 38, No. 15, 18.07.2002, p. 776-777.

Research output: Contribution to journalArticle

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