| Original language | English |
|---|---|
| Title of host publication | IEEE Int. Symp. on Defect and Fault Tolerance in VLSI Systems (DFT) |
| Place of Publication | Yamanashi |
| Publication status | Published - 2000 Oct |
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Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
| Original language | English |
|---|---|
| Title of host publication | IEEE Int. Symp. on Defect and Fault Tolerance in VLSI Systems (DFT) |
| Place of Publication | Yamanashi |
| Publication status | Published - 2000 Oct |