| Original language | English |
|---|---|
| Title of host publication | 1st VLSI Test Technology Workshop (VTTW) |
| Place of Publication | Hsinchu |
| Publication status | Published - 2007 Jul |
BRAINS+: A Memory Built-in Self-Repair Generator
Cheng-Wen Wu, M.-S. Lee
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution