Built-in high resolution signal generator for testing ADC and DAC

Yeong Jar Chang, Soon-Jyh Chang, Jung Chi Ho, Chee Kian Ong, Ting Cheng, Wen Ching Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

This paper presents a design of the built-in high resolution signal generator for testing analog-to-digital converter (ADC) and digital-to-analog converter (DAC). The sigma-delta demodulator scheme is used in the design to generate on-chip high accurate stimulus. We discuss the issues on the generation of all the required stimuli using the same circuitry and other issues on implementing this scheme. Our signal generator can be applied to test the embedded 13-bit ADC and DAC in Asvmmetry Digital Subscriber Line System on a Chip (ADSL SoC).

Original languageEnglish
Title of host publicationVLSI 2003 - 2003 20th International Symposium on VLSI Technology, Systems and Applications, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages231-234
Number of pages4
ISBN (Electronic)0780377656
DOIs
Publication statusPublished - 2003 Jan 1
Event20th International Symposium on VLSI Technology, Systems and Applications, VLSI 2003 - Hsinchu, Taiwan
Duration: 2003 Oct 62003 Oct 8

Publication series

NameInternational Symposium on VLSI Technology, Systems, and Applications, Proceedings
Volume2003-January
ISSN (Print)1930-8868

Other

Other20th International Symposium on VLSI Technology, Systems and Applications, VLSI 2003
CountryTaiwan
CityHsinchu
Period03-10-0603-10-08

Fingerprint

digital to analog converters
signal generators
Signal generators
analog to digital converters
Digital to analog conversion
stimuli
systems-on-a-chip
demodulators
high resolution
Testing
chips
Digital subscriber lines
Demodulators

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Chang, Y. J., Chang, S-J., Ho, J. C., Ong, C. K., Cheng, T., & Wu, W. C. (2003). Built-in high resolution signal generator for testing ADC and DAC. In VLSI 2003 - 2003 20th International Symposium on VLSI Technology, Systems and Applications, Proceedings (pp. 231-234). [1252595] (International Symposium on VLSI Technology, Systems, and Applications, Proceedings; Vol. 2003-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/VTSA.2003.1252595
Chang, Yeong Jar ; Chang, Soon-Jyh ; Ho, Jung Chi ; Ong, Chee Kian ; Cheng, Ting ; Wu, Wen Ching. / Built-in high resolution signal generator for testing ADC and DAC. VLSI 2003 - 2003 20th International Symposium on VLSI Technology, Systems and Applications, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2003. pp. 231-234 (International Symposium on VLSI Technology, Systems, and Applications, Proceedings).
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Chang, YJ, Chang, S-J, Ho, JC, Ong, CK, Cheng, T & Wu, WC 2003, Built-in high resolution signal generator for testing ADC and DAC. in VLSI 2003 - 2003 20th International Symposium on VLSI Technology, Systems and Applications, Proceedings., 1252595, International Symposium on VLSI Technology, Systems, and Applications, Proceedings, vol. 2003-January, Institute of Electrical and Electronics Engineers Inc., pp. 231-234, 20th International Symposium on VLSI Technology, Systems and Applications, VLSI 2003, Hsinchu, Taiwan, 03-10-06. https://doi.org/10.1109/VTSA.2003.1252595

Built-in high resolution signal generator for testing ADC and DAC. / Chang, Yeong Jar; Chang, Soon-Jyh; Ho, Jung Chi; Ong, Chee Kian; Cheng, Ting; Wu, Wen Ching.

VLSI 2003 - 2003 20th International Symposium on VLSI Technology, Systems and Applications, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2003. p. 231-234 1252595 (International Symposium on VLSI Technology, Systems, and Applications, Proceedings; Vol. 2003-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Chang YJ, Chang S-J, Ho JC, Ong CK, Cheng T, Wu WC. Built-in high resolution signal generator for testing ADC and DAC. In VLSI 2003 - 2003 20th International Symposium on VLSI Technology, Systems and Applications, Proceedings. Institute of Electrical and Electronics Engineers Inc. 2003. p. 231-234. 1252595. (International Symposium on VLSI Technology, Systems, and Applications, Proceedings). https://doi.org/10.1109/VTSA.2003.1252595