Built-in high resolution signal generator for testing ADC and DAC

Yeong Jar Chang; Soon Jyh Chang; Jung Chi Ho; Chee Kian Ong; Ting Cheng; Wen Ching Wu

doi:10.1109/VTSA.2003.1252595

Built-in high resolution signal generator for testing ADC and DAC

Yeong Jar Chang, Soon Jyh Chang, Jung Chi Ho, Chee Kian Ong, Ting Cheng, Wen Ching Wu

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

7 Citations (Scopus)

Abstract

This paper presents a design of the built-in high resolution signal generator for testing analog-to-digital converter (ADC) and digital-to-analog converter (DAC). The sigma-delta demodulator scheme is used in the design to generate on-chip high accurate stimulus. We discuss the issues on the generation of all the required stimuli using the same circuitry and other issues on implementing this scheme. Our signal generator can be applied to test the embedded 13-bit ADC and DAC in Asvmmetry Digital Subscriber Line System on a Chip (ADSL SoC).

Original language	English
Title of host publication	VLSI 2003 - 2003 20th International Symposium on VLSI Technology, Systems and Applications, Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	231-234
Number of pages	4
ISBN (Electronic)	0780377656
DOIs	https://doi.org/10.1109/VTSA.2003.1252595
Publication status	Published - 2003 Jan 1
Event	20th International Symposium on VLSI Technology, Systems and Applications, VLSI 2003 - Hsinchu, Taiwan Duration: 2003 Oct 6 → 2003 Oct 8

Publication series

Name	International Symposium on VLSI Technology, Systems, and Applications, Proceedings
Volume	2003-January
ISSN (Print)	1930-8868

Other

Other	20th International Symposium on VLSI Technology, Systems and Applications, VLSI 2003
Country/Territory	Taiwan
City	Hsinchu
Period	03-10-06 → 03-10-08

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/VTSA.2003.1252595

Cite this

Chang, Y. J., Chang, S. J., Ho, J. C., Ong, C. K., Cheng, T., & Wu, W. C. (2003). Built-in high resolution signal generator for testing ADC and DAC. In VLSI 2003 - 2003 20th International Symposium on VLSI Technology, Systems and Applications, Proceedings (pp. 231-234). [1252595] (International Symposium on VLSI Technology, Systems, and Applications, Proceedings; Vol. 2003-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/VTSA.2003.1252595

Chang, Yeong Jar ; Chang, Soon Jyh ; Ho, Jung Chi et al. / Built-in high resolution signal generator for testing ADC and DAC. VLSI 2003 - 2003 20th International Symposium on VLSI Technology, Systems and Applications, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2003. pp. 231-234 (International Symposium on VLSI Technology, Systems, and Applications, Proceedings).

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title = "Built-in high resolution signal generator for testing ADC and DAC",

abstract = "This paper presents a design of the built-in high resolution signal generator for testing analog-to-digital converter (ADC) and digital-to-analog converter (DAC). The sigma-delta demodulator scheme is used in the design to generate on-chip high accurate stimulus. We discuss the issues on the generation of all the required stimuli using the same circuitry and other issues on implementing this scheme. Our signal generator can be applied to test the embedded 13-bit ADC and DAC in Asvmmetry Digital Subscriber Line System on a Chip (ADSL SoC).",

author = "Chang, {Yeong Jar} and Chang, {Soon Jyh} and Ho, {Jung Chi} and Ong, {Chee Kian} and Ting Cheng and Wu, {Wen Ching}",

year = "2003",

month = jan,

day = "1",

doi = "10.1109/VTSA.2003.1252595",

language = "English",

series = "International Symposium on VLSI Technology, Systems, and Applications, Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "231--234",

booktitle = "VLSI 2003 - 2003 20th International Symposium on VLSI Technology, Systems and Applications, Proceedings",

address = "United States",

note = "20th International Symposium on VLSI Technology, Systems and Applications, VLSI 2003 ; Conference date: 06-10-2003 Through 08-10-2003",

}

Chang, YJ, Chang, SJ, Ho, JC, Ong, CK, Cheng, T & Wu, WC 2003, Built-in high resolution signal generator for testing ADC and DAC. in VLSI 2003 - 2003 20th International Symposium on VLSI Technology, Systems and Applications, Proceedings., 1252595, International Symposium on VLSI Technology, Systems, and Applications, Proceedings, vol. 2003-January, Institute of Electrical and Electronics Engineers Inc., pp. 231-234, 20th International Symposium on VLSI Technology, Systems and Applications, VLSI 2003, Hsinchu, Taiwan, 03-10-06. https://doi.org/10.1109/VTSA.2003.1252595

Built-in high resolution signal generator for testing ADC and DAC. / Chang, Yeong Jar; Chang, Soon Jyh; Ho, Jung Chi et al.
VLSI 2003 - 2003 20th International Symposium on VLSI Technology, Systems and Applications, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2003. p. 231-234 1252595 (International Symposium on VLSI Technology, Systems, and Applications, Proceedings; Vol. 2003-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AB - This paper presents a design of the built-in high resolution signal generator for testing analog-to-digital converter (ADC) and digital-to-analog converter (DAC). The sigma-delta demodulator scheme is used in the design to generate on-chip high accurate stimulus. We discuss the issues on the generation of all the required stimuli using the same circuitry and other issues on implementing this scheme. Our signal generator can be applied to test the embedded 13-bit ADC and DAC in Asvmmetry Digital Subscriber Line System on a Chip (ADSL SoC).

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M3 - Conference contribution

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Chang YJ, Chang SJ, Ho JC, Ong CK, Cheng T, Wu WC. Built-in high resolution signal generator for testing ADC and DAC. In VLSI 2003 - 2003 20th International Symposium on VLSI Technology, Systems and Applications, Proceedings. Institute of Electrical and Electronics Engineers Inc. 2003. p. 231-234. 1252595. (International Symposium on VLSI Technology, Systems, and Applications, Proceedings). doi: 10.1109/VTSA.2003.1252595

Built-in high resolution signal generator for testing ADC and DAC

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