Built-in self-test of iterative logic arrays

Cheng-Wen Wu, S.-K. Lu, J.-C. Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationInternational Electron Devices and Material Symposium (EDMS)
Place of PublicationHsinchu
Pages485-488
Publication statusPublished - 1990 Nov

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