Built-In Test and Diagnosis for TSVs with Different Placement Topologies and Crosstalk Impact Ranges

Wen Hsuan Hsu, Michael Andreas Kochte, Kuen Jong Lee

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

Through silicon vias (TSVs) play an important role in 3-D chip integration. Effective and efficient testing for correct operation of TSVs is essential for 3-D integrated circuit design. This paper addresses the post-bond test and diagnosis of crosstalk faults among TSVs considering different impact ranges, and proposes a TSV grouping method for rectangular and hexagonal TSV placements such that as many TSVs as possible are tested simultaneously. Based on the results of the TSV grouping, we implement a high-efficiency, low-area-overhead TSV test architecture that reuses the existing boundary scan or IEEE 1500 wrapper cells typically present for prebond testing. Experimental results show the short test and diagnosis time as well as the low area overhead of the proposed test architecture.

Original languageEnglish
Pages (from-to)1004-1017
Number of pages14
JournalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume36
Issue number6
DOIs
Publication statusPublished - 2017 Jun

All Science Journal Classification (ASJC) codes

  • Software
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

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