Capacitor-current-sensor calibration technique and application in a 4-phase buck converter with load-transient optimization

Szu Yu Huang, Kuan Yu Fang, Yi Wei Huang, Shih Hsiung Chien, Tai Haur Kuo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

14 Citations (Scopus)

Abstract

For switching DC-DC converters, a large and rapid load-current transient ΔIload causes a large output voltage undershoot ΔVUS and long settling time ts if the transient responses are slow [1]. Since the output capacitor current ICo instantly reflects ΔIload, transient response optimization for minimizing ΔVUS and ts with given charging and discharging slopes of inductor current ILo can be achieved by obtaining an accurate ICo and well-controlling the ILo charging time tch and discharging time tdch [1]. However, ICo sensing accuracy is degraded if the output capacitor's impedance ZCo, comprising the capacitance CO, equivalent series resistance RESR and inductance LESL, varies with different output voltage VO, process variation, and/or PCB parasitics, leading to non-minimized ΔVUS and ts. An off-chip capacitor-current-sensor (CCS) calibration technique is reported in [2]; however, LESL is not considered, so the high-frequency information of ΔIload is inaccurately sensed when large and rapid ΔIload occurs. On the other hand, to well-control the tch and tdch of ILo, the transient-optimized feedback circuit reported in [1] minimizes ΔVUS and ts. However, optimization can be achieved only under fixed CO, output inductor LO, input voltage VIN, and VO.

Original languageEnglish
Title of host publication2016 IEEE International Solid-State Circuits Conference, ISSCC 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages228-229
Number of pages2
ISBN (Electronic)9781467394666
DOIs
Publication statusPublished - 2016 Feb 23
Event63rd IEEE International Solid-State Circuits Conference, ISSCC 2016 - San Francisco, United States
Duration: 2016 Jan 312016 Feb 4

Publication series

NameDigest of Technical Papers - IEEE International Solid-State Circuits Conference
Volume59
ISSN (Print)0193-6530

Other

Other63rd IEEE International Solid-State Circuits Conference, ISSCC 2016
CountryUnited States
CitySan Francisco
Period16-01-3116-02-04

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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