Carrier Lifetimes of Iodine-Doped CdMgTe/CdSeTe Double Heterostructures Grown by Molecular Beam Epitaxy

  • S. Sohal
  • , M. Edirisooriya
  • , O. S. Ogedengbe
  • , J. E. Petersen
  • , C. H. Swartz
  • , E. G. LeBlanc
  • , T. H. Myers
  • , J. V. Li
  • , M. Holtz

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

Iodine-doped CdMgTe/CdSeTe double heterostructures (DHs) have been grown by molecular beam epitaxy and studied using time-resolved photoluminescence (PL), focusing on absorber layer thickness of 2 μm. The n-type free carrier concentration was varied to ∼7 × 1015 cm−3, 8.4 × 1016 cm−3, and 8.4 × 1017 cm−3 using iodine as dopant in DHs. Optical injection at 1 × 1010 photons/pulse/cm2 to 3 × 1011 photons/pulse/cm2, corresponding to initial injection of photocarriers up to ∼8 × 1015 cm−3, was applied to examine the effects of excess carrier concentration on the PL lifetimes. Iodine-doped DHs exhibited an initial rapid decay followed by a slower decay at free carrier concentration of 7 × 1015 cm−3 and 8.4 × 1016 cm−3. The optical injection dependence of the carrier lifetimes for DHs was interpreted based on the Shockley–Read–Hall model. The observed decrease in lifetime with increasing n is consistent with growing importance of radiative recombination.

Original languageEnglish
Pages (from-to)5361-5366
Number of pages6
JournalJournal of Electronic Materials
Volume46
Issue number9
DOIs
Publication statusPublished - 2017 Sept 1

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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