Abstract
Iodine-doped CdMgTe/CdSeTe double heterostructures (DHs) have been grown by molecular beam epitaxy and studied using time-resolved photoluminescence (PL), focusing on absorber layer thickness of 2 μm. The n-type free carrier concentration was varied to ∼7 × 1015 cm−3, 8.4 × 1016 cm−3, and 8.4 × 1017 cm−3 using iodine as dopant in DHs. Optical injection at 1 × 1010 photons/pulse/cm2 to 3 × 1011 photons/pulse/cm2, corresponding to initial injection of photocarriers up to ∼8 × 1015 cm−3, was applied to examine the effects of excess carrier concentration on the PL lifetimes. Iodine-doped DHs exhibited an initial rapid decay followed by a slower decay at free carrier concentration of 7 × 1015 cm−3 and 8.4 × 1016 cm−3. The optical injection dependence of the carrier lifetimes for DHs was interpreted based on the Shockley–Read–Hall model. The observed decrease in lifetime with increasing n is consistent with growing importance of radiative recombination.
| Original language | English |
|---|---|
| Pages (from-to) | 5361-5366 |
| Number of pages | 6 |
| Journal | Journal of Electronic Materials |
| Volume | 46 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - 2017 Sept 1 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry