Cell-Aware Test Generation Time Reduction by Using Switch-Level ATPG

Cheng-Wen Wu, P.-Y. Chuang, H. H. Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationIEEE Int. Test Conf. in Asia (ITC-A)
Place of PublicationTaipei
Publication statusPublished - 2017 Sep

Cite this

Wu, C-W., Chuang, P-Y., & Chen, H. H. (2017). Cell-Aware Test Generation Time Reduction by Using Switch-Level ATPG. In IEEE Int. Test Conf. in Asia (ITC-A)