| Original language | English |
|---|---|
| Title of host publication | IEEE Int. Test Conf. in Asia (ITC-A) |
| Place of Publication | Taipei |
| Publication status | Published - 2017 Sep |
Cell-Aware Test Generation Time Reduction by Using Switch-Level ATPG
Cheng-Wen Wu, P.-Y. Chuang, H. H. Chen
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
3
Citations
(Scopus)