Characteristics and improvement in hot-carrier reliability of sub-micrometer High-voltage double diffused drain metal-oxide-semiconductor field-effect transistors

Jone-Fang Chen, Kuo Ming Wu, J. R. Lee, Yan Kuin Su, H. C. Wang, Yu-Cheng Lin, S. L. Hsu

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4 Citations (Scopus)

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Physics & Astronomy

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