Characteristics of δ-doped InP heterostructures using In 0.34Al 0.66As 0.85Sb 0.15 Schottky layer

Wei Chou Hsu, Ching Sung Lee, Yu Shyan Lin

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9 Citations (Scopus)

Abstract

Single and coupled δ-doped InP channel heterostructure field-effect transistors using high barrier height (>0.73 eV) and wide energy band gap (∼1.8 eV) In 0.34Al 0.66As 0.85Sb 0.15 Schottky layer have been successfully grown by low-pressure metalorganic chemical vapor deposition. Comprehensive material characterizations have been conducted and investigated for various growth specifications, including the Hall measurement, secondary ion mass spectrometry, double crystal x-ray diffraction technique, and photoluminescence measurement. Excellent gate-source breakdown characteristics (>40 V), low leakage current (111 μA/mm), improved gate voltage swing, improved carrier mobility, good saturation and pinch-off properties, and low output conductance (0.5 mS/mm) have been achieved by using the high barrier height In 0.34Al 0.66As 0.85Sb 0.15 Schottky layer and InP channels. The proposed structure provides good potential for high-power circuit applications.

Original languageEnglish
Pages (from-to)1385-1390
Number of pages6
JournalJournal of Applied Physics
Volume91
Issue number3
DOIs
Publication statusPublished - 2002 Feb 1

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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