In this paper, a novel method is developed to measure simultaneously the Seebeck coefficient and thermal conductivity in the cross-plane direction of thin films. Using a differential measurement between a superlattice sample and a reference sample, the temperature and voltage drops cross the superlattice thin film are determined and used to deduce its cross plane thermal conductivity and Seebeck coefficient.
|Number of pages||4|
|Publication status||Published - 2001|
|Event||20th International Conference on Thermoelectrics ICT'01 - Beijing, China|
Duration: 2001 Jun 8 → 2001 Jun 11
|Conference||20th International Conference on Thermoelectrics ICT'01|
|Period||01-06-08 → 01-06-11|
All Science Journal Classification (ASJC) codes