Characterization of cross-plane thermoelectric properties of Si/Ge superlattices

Bao Yang, Jianlin Liu, Kang Wang, Gang Chen

Research output: Contribution to conferencePaperpeer-review

6 Citations (Scopus)

Abstract

In this paper, a novel method is developed to measure simultaneously the Seebeck coefficient and thermal conductivity in the cross-plane direction of thin films. Using a differential measurement between a superlattice sample and a reference sample, the temperature and voltage drops cross the superlattice thin film are determined and used to deduce its cross plane thermal conductivity and Seebeck coefficient.

Original languageEnglish
Pages344-347
Number of pages4
Publication statusPublished - 2001
Event20th International Conference on Thermoelectrics ICT'01 - Beijing, China
Duration: 2001 Jun 82001 Jun 11

Conference

Conference20th International Conference on Thermoelectrics ICT'01
CountryChina
CityBeijing
Period01-06-0801-06-11

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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