Abstract
In this paper, a novel method is developed to measure simultaneously the Seebeck coefficient and thermal conductivity in the cross-plane direction of thin films. Using a differential measurement between a superlattice sample and a reference sample, the temperature and voltage drops cross the superlattice thin film are determined and used to deduce its cross plane thermal conductivity and Seebeck coefficient.
Original language | English |
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Pages | 344-347 |
Number of pages | 4 |
Publication status | Published - 2001 |
Event | 20th International Conference on Thermoelectrics ICT'01 - Beijing, China Duration: 2001 Jun 8 → 2001 Jun 11 |
Conference
Conference | 20th International Conference on Thermoelectrics ICT'01 |
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Country/Territory | China |
City | Beijing |
Period | 01-06-08 → 01-06-11 |
All Science Journal Classification (ASJC) codes
- Engineering(all)