Characterization of cross-plane thermoelectric properties of Si/Ge superlattices

Bao Yang; Jianlin Liu; Kang Wang; Gang Chen

Characterization of cross-plane thermoelectric properties of Si/Ge superlattices

Bao Yang, Jianlin Liu, Kang Wang, Gang Chen

College of Electrical Engineering and Computer Science

Research output: Contribution to conference › Paper › peer-review

6 Citations (Scopus)

Abstract

In this paper, a novel method is developed to measure simultaneously the Seebeck coefficient and thermal conductivity in the cross-plane direction of thin films. Using a differential measurement between a superlattice sample and a reference sample, the temperature and voltage drops cross the superlattice thin film are determined and used to deduce its cross plane thermal conductivity and Seebeck coefficient.

Original language	English
Pages	344-347
Number of pages	4
Publication status	Published - 2001
Event	20th International Conference on Thermoelectrics ICT'01 - Beijing, China Duration: 2001 Jun 8 → 2001 Jun 11

Conference

Conference	20th International Conference on Thermoelectrics ICT'01
Country	China
City	Beijing
Period	01-06-08 → 01-06-11

All Science Journal Classification (ASJC) codes

Engineering(all)

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@conference{11d0e18d421a4b34bb2999f6310af384,

title = "Characterization of cross-plane thermoelectric properties of Si/Ge superlattices",

abstract = "In this paper, a novel method is developed to measure simultaneously the Seebeck coefficient and thermal conductivity in the cross-plane direction of thin films. Using a differential measurement between a superlattice sample and a reference sample, the temperature and voltage drops cross the superlattice thin film are determined and used to deduce its cross plane thermal conductivity and Seebeck coefficient.",

author = "Bao Yang and Jianlin Liu and Kang Wang and Gang Chen",

year = "2001",

language = "English",

pages = "344--347",

}

TY - CONF

T1 - Characterization of cross-plane thermoelectric properties of Si/Ge superlattices

AU - Yang, Bao

AU - Liu, Jianlin

AU - Wang, Kang

AU - Chen, Gang

PY - 2001

Y1 - 2001

N2 - In this paper, a novel method is developed to measure simultaneously the Seebeck coefficient and thermal conductivity in the cross-plane direction of thin films. Using a differential measurement between a superlattice sample and a reference sample, the temperature and voltage drops cross the superlattice thin film are determined and used to deduce its cross plane thermal conductivity and Seebeck coefficient.

AB - In this paper, a novel method is developed to measure simultaneously the Seebeck coefficient and thermal conductivity in the cross-plane direction of thin films. Using a differential measurement between a superlattice sample and a reference sample, the temperature and voltage drops cross the superlattice thin film are determined and used to deduce its cross plane thermal conductivity and Seebeck coefficient.

UR - http://www.scopus.com/inward/record.url?scp=0035705618&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035705618&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0035705618

SP - 344

EP - 347

T2 - 20th International Conference on Thermoelectrics ICT'01

Y2 - 8 June 2001 through 11 June 2001

ER -

Characterization of cross-plane thermoelectric properties of Si/Ge superlattices

Abstract

Conference

All Science Journal Classification (ASJC) codes

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