Characterization of electrochromic tungsten oxide film from electrochemical anodized RF-sputtered tungsten films

Chun Kai Wang; Chung Kwei Lin; Ching Lin Wu; Sanjaya Brahma; Sheng Chang Wang; Jow Lay Huang

doi:10.1016/j.ceramint.2012.11.010

Characterization of electrochromic tungsten oxide film from electrochemical anodized RF-sputtered tungsten films

Chun Kai Wang
, Chung Kwei Lin
, Ching Lin Wu
, Sanjaya Brahma
, Sheng Chang Wang
, Jow Lay Huang

Research output: Contribution to journal › Article › peer-review

26 Citations (Scopus)

Abstract

Tungsten oxide (WO₃) films prepared by annealing electrochemically anodized metallic tungsten (W) films deposited by radio-frequency sputtering were characterized. Tungsten oxide films of various morphology, crystallinity, and porosity can be prepared by carefully altering the anodization time (20-50 min) and annealing temperature (450-550 °C). The film obtained after 40 min of anodization, and that annealed at 500 °C shows the best electrochromic performance with optical modulation of 43.6% and coloration efficiency of 42.8 cm²/C. The effects of anodization time and annealing temperature on microstructure and electrochromic properties were addressed.

Original language	English
Pages (from-to)	4293-4298
Number of pages	6
Journal	Ceramics International
Volume	39
Issue number	4
DOIs	https://doi.org/10.1016/j.ceramint.2012.11.010
Publication status	Published - 2013 May

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Ceramics and Composites
Process Chemistry and Technology
Surfaces, Coatings and Films
Materials Chemistry

Access to Document

10.1016/j.ceramint.2012.11.010

Cite this

@article{149d5f4887e9490aaa9b1d005657612c,

title = "Characterization of electrochromic tungsten oxide film from electrochemical anodized RF-sputtered tungsten films",

abstract = "Tungsten oxide (WO3) films prepared by annealing electrochemically anodized metallic tungsten (W) films deposited by radio-frequency sputtering were characterized. Tungsten oxide films of various morphology, crystallinity, and porosity can be prepared by carefully altering the anodization time (20-50 min) and annealing temperature (450-550 °C). The film obtained after 40 min of anodization, and that annealed at 500 °C shows the best electrochromic performance with optical modulation of 43.6\% and coloration efficiency of 42.8 cm2/C. The effects of anodization time and annealing temperature on microstructure and electrochromic properties were addressed.",

author = "Wang, \{Chun Kai\} and Lin, \{Chung Kwei\} and Wu, \{Ching Lin\} and Sanjaya Brahma and Wang, \{Sheng Chang\} and Huang, \{Jow Lay\}",

note = "Funding Information: The authors acknowledge the National Science Council of Taiwan for financial support of this research under Grant NSC 100-3113-E-006-004 . ",

year = "2013",

month = may,

doi = "10.1016/j.ceramint.2012.11.010",

language = "English",

volume = "39",

pages = "4293--4298",

journal = "Ceramics International",

issn = "0272-8842",

publisher = "Elsevier Limited",

number = "4",

}

TY - JOUR

T1 - Characterization of electrochromic tungsten oxide film from electrochemical anodized RF-sputtered tungsten films

AU - Wang, Chun Kai

AU - Lin, Chung Kwei

AU - Wu, Ching Lin

AU - Brahma, Sanjaya

AU - Wang, Sheng Chang

AU - Huang, Jow Lay

N1 - Funding Information: The authors acknowledge the National Science Council of Taiwan for financial support of this research under Grant NSC 100-3113-E-006-004 .

PY - 2013/5

Y1 - 2013/5

N2 - Tungsten oxide (WO3) films prepared by annealing electrochemically anodized metallic tungsten (W) films deposited by radio-frequency sputtering were characterized. Tungsten oxide films of various morphology, crystallinity, and porosity can be prepared by carefully altering the anodization time (20-50 min) and annealing temperature (450-550 °C). The film obtained after 40 min of anodization, and that annealed at 500 °C shows the best electrochromic performance with optical modulation of 43.6% and coloration efficiency of 42.8 cm2/C. The effects of anodization time and annealing temperature on microstructure and electrochromic properties were addressed.

AB - Tungsten oxide (WO3) films prepared by annealing electrochemically anodized metallic tungsten (W) films deposited by radio-frequency sputtering were characterized. Tungsten oxide films of various morphology, crystallinity, and porosity can be prepared by carefully altering the anodization time (20-50 min) and annealing temperature (450-550 °C). The film obtained after 40 min of anodization, and that annealed at 500 °C shows the best electrochromic performance with optical modulation of 43.6% and coloration efficiency of 42.8 cm2/C. The effects of anodization time and annealing temperature on microstructure and electrochromic properties were addressed.

UR - https://www.scopus.com/pages/publications/84874661782

UR - https://www.scopus.com/pages/publications/84874661782#tab=citedBy

U2 - 10.1016/j.ceramint.2012.11.010

DO - 10.1016/j.ceramint.2012.11.010

M3 - Article

AN - SCOPUS:84874661782

SN - 0272-8842

VL - 39

SP - 4293

EP - 4298

JO - Ceramics International

JF - Ceramics International

IS - 4

ER -

Characterization of electrochromic tungsten oxide film from electrochemical anodized RF-sputtered tungsten films

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this