CHARACTERIZATION OF GeSi/Si STRAIED LAYER SUPERLATTICE AVALANCHE PHOTODIODE

F. Y. Huang, Kevin Alt, K. L. Wang

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Integrated Photonics Research, IPR 1996
Publisher	Optica Publishing Group (formerly OSA)
Pages	265-268
Number of pages	4
ISBN (Electronic)	1557524394
Publication status	Published - 1996
Event	Integrated Photonics Research, IPR 1996 - Boston, United States Duration: 1996 Apr 29 → 1996 Apr 29

Name	Optics InfoBase Conference Papers
ISSN (Electronic)	2162-2701

Conference	Integrated Photonics Research, IPR 1996
Country/Territory	United States
City	Boston
Period	96-04-29 → 96-04-29

All Science Journal Classification (ASJC) codes

@inproceedings{360033e295234edbbf898db6343e8d28,

title = "CHARACTERIZATION OF GeSi/Si STRAIED LAYER SUPERLATTICE AVALANCHE PHOTODIODE",

author = "Huang, {F. Y.} and Kevin Alt and Wang, {K. L.}",

year = "1996",

language = "English",

series = "Optics InfoBase Conference Papers",

publisher = "Optica Publishing Group (formerly OSA)",

pages = "265--268",

booktitle = "Integrated Photonics Research, IPR 1996",

note = "Integrated Photonics Research, IPR 1996 ; Conference date: 29-04-1996 Through 29-04-1996",

}

TY - GEN

T1 - CHARACTERIZATION OF GeSi/Si STRAIED LAYER SUPERLATTICE AVALANCHE PHOTODIODE

AU - Huang, F. Y.

AU - Alt, Kevin

AU - Wang, K. L.

PY - 1996

Y1 - 1996

UR - http://www.scopus.com/inward/record.url?scp=85135302961&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85135302961&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:85135302961

T3 - Optics InfoBase Conference Papers

SP - 265

EP - 268

BT - Integrated Photonics Research, IPR 1996

PB - Optica Publishing Group (formerly OSA)

T2 - Integrated Photonics Research, IPR 1996

Y2 - 29 April 1996 through 29 April 1996

ER -