Characterization of interfacial properties in magnetic tunnel junctions by bias-dependent complex impedance spectroscopy

C. Y. Hsu, J. C.A. Huang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationINTERMAG ASIA 2005
Subtitle of host publicationDigests of the IEEE International Magnetics Conference
PublisherIEEE Computer Society
Number of pages1
ISBN (Print)0780390091, 9780780390096
DOIs
Publication statusPublished - 2005 Jan 1
EventINTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference - Nagoya, Japan
Duration: 2005 Apr 42005 Apr 8

Publication series

NameINTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference

Other

OtherINTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference
Country/TerritoryJapan
CityNagoya
Period05-04-0405-04-08

All Science Journal Classification (ASJC) codes

  • General Engineering

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