Characterization of p-type CuAlO2 thin films grown by chemical solution deposition

S. H. Chiu, J. C.A. Huang

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)

Abstract

Single phase p-type CuAlO2 thin films were synthesized through the chemical solution deposition method. The effects of post annealing temperature on the micro-structural, morphological and electrical properties have been studied. Via the optimized annealing treatment, the Hall effect measurements indicate that the CuAlO2 film belongs to the p-type semiconductor with intrinsic hole carriers of 6.71×1016cm-3. The optical direct bandgap of the CuAlO2 film was estimated to be 3.48eV by room temperature photoluminescence measurement, while the transmittance in the visible region was as high as 70%.

Original languageEnglish
Pages (from-to)239-242
Number of pages4
JournalSurface and Coatings Technology
Volume231
DOIs
Publication statusPublished - 2013 Sep 25

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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