@inproceedings{efa724d662d943bea0c9aca0977b0f8b,
title = "Characterization of subwavelength-scale marginal roughness from far-field irradiance",
abstract = "A constructed-aperture approach is proposed to measure marginal roughness by far-field irradiance. It is numerically shown that spatial profile could be retrieved with an error less than 3%, even its variation is in subwavelength scale.",
author = "Chern, {Jyh Long} and Chu, {Shu Chun}",
year = "2006",
month = jan,
day = "1",
language = "English",
isbn = "1557528187",
series = "Optics InfoBase Conference Papers",
publisher = "Optical Society of America",
booktitle = "Laser Science, LS 2006",
note = "Laser Science, LS 2006 ; Conference date: 10-10-2006 Through 10-10-2006",
}