TY - GEN
T1 - Characterization of subwavelength-scale marginal roughness from far-field irradiance
AU - Chern, Jyh Long
AU - Chu, Shu Chun
PY - 2006
Y1 - 2006
N2 - A constructed-aperture approach is proposed to measure marginal roughness by far-field irradiance. It is numerically shown that spatial profile could be retrieved with an error less than 3%, even its variation is in subwavelength scale.
AB - A constructed-aperture approach is proposed to measure marginal roughness by far-field irradiance. It is numerically shown that spatial profile could be retrieved with an error less than 3%, even its variation is in subwavelength scale.
UR - http://www.scopus.com/inward/record.url?scp=85088719211&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85088719211&partnerID=8YFLogxK
U2 - 10.1364/fio.2006.jsua38
DO - 10.1364/fio.2006.jsua38
M3 - Conference contribution
AN - SCOPUS:85088719211
SN - 1557528187
SN - 9781557528186
T3 - Optics InfoBase Conference Papers
BT - Optical Fabrication and Testing, OFT 2006
PB - Optical Society of America (OSA)
T2 - Optical Fabrication and Testing, OFT 2006
Y2 - 10 October 2006 through 10 October 2006
ER -