Characterization of subwavelength-scale marginal roughness from far-field irradiance

Jyh Long Chern; Shu Chun Chu

Characterization of subwavelength-scale marginal roughness from far-field irradiance

Department of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A constructed-aperture approach is proposed to measure marginal roughness by far-field irradiance. It is numerically shown that spatial profile could be retrieved with an error less than 3%, even its variation is in subwavelength scale.

Original language	English
Title of host publication	Laser Science, LS 2006
Publisher	Optica Publishing Group (formerly OSA)
ISBN (Electronic)	1557528187
Publication status	Published - 2006
Event	Laser Science, LS 2006 - Rochester, NY, United States Duration: 2006 Oct 10 → 2006 Oct 10

Publication series

Name	Optics InfoBase Conference Papers
ISSN (Electronic)	2162-2701

Other

Other	Laser Science, LS 2006
Country/Territory	United States
City	Rochester, NY
Period	06-10-10 → 06-10-10

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Mechanics of Materials

Cite this

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title = "Characterization of subwavelength-scale marginal roughness from far-field irradiance",

abstract = "A constructed-aperture approach is proposed to measure marginal roughness by far-field irradiance. It is numerically shown that spatial profile could be retrieved with an error less than 3%, even its variation is in subwavelength scale.",

author = "Chern, {Jyh Long} and Chu, {Shu Chun}",

note = "Publisher Copyright: {\textcopyright} 2006 Optical Society of America.; Laser Science, LS 2006 ; Conference date: 10-10-2006 Through 10-10-2006",

year = "2006",

language = "English",

series = "Optics InfoBase Conference Papers",

publisher = "Optica Publishing Group (formerly OSA)",

booktitle = "Laser Science, LS 2006",

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T1 - Characterization of subwavelength-scale marginal roughness from far-field irradiance

AU - Chern, Jyh Long

AU - Chu, Shu Chun

PY - 2006

Y1 - 2006

N2 - A constructed-aperture approach is proposed to measure marginal roughness by far-field irradiance. It is numerically shown that spatial profile could be retrieved with an error less than 3%, even its variation is in subwavelength scale.

AB - A constructed-aperture approach is proposed to measure marginal roughness by far-field irradiance. It is numerically shown that spatial profile could be retrieved with an error less than 3%, even its variation is in subwavelength scale.

UR - http://www.scopus.com/inward/record.url?scp=85136242085&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85136242085&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:85136242085

T3 - Optics InfoBase Conference Papers

BT - Laser Science, LS 2006

PB - Optica Publishing Group (formerly OSA)

T2 - Laser Science, LS 2006

Y2 - 10 October 2006 through 10 October 2006

ER -

Characterization of subwavelength-scale marginal roughness from far-field irradiance

Abstract

Publication series

Other

All Science Journal Classification (ASJC) codes

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