Characterization of the signature of subwavelength variation from far-field irradiance

Shu-Chun Chu, Jyh Long Chern

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

The dynamic signature of the subwavelength variation of a slit is shown to be determinable from far-field irradiance with a precision of better than 1 nm. One can increase the efficiency of measurement of the subwavelength's signature by adjusting the detection width over which the subwavelength variation is detected. The subwavelength variation of a rectangular aperture was also examined to show the general feasibility.

Original languageEnglish
Pages (from-to)1045-1047
Number of pages3
JournalOptics Letters
Volume29
Issue number10
DOIs
Publication statusPublished - 2004 May 15

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

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