Characterization of voltage-driven twisted nematic liquid crystal cell by dynamic polarization scanning ellipsometry

Huan Hsu Lin, Quoc Hung Phan, Yu Lung Lo

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

A dynamic polarization scanning ellipsometry technique based on Stokes polarimetry is proposed for dynamically characterizing a voltagedriven twisted nematic liquid crystal (TNLC) cell. In the proposed method, the six effective ellipsometric parameters are extracted under modulation voltages ranging from 0 V ∼ + 10 V using four linearly polarized input lights. The profiles of the tilt angle and twist angle are calculated as a function of the modulation voltage. The validity of the proposed method is confirmed by comparing the experimental results for the effective ellipsometric parameters of a TNLC cell with the analytical results. Furthermore, a genetic algorithm (GA) based on a curve-fitting technique is used to inversely extract the pretilt angle, twist angle and rubbing direction of the TNLC cell. These extracted values are then compared to the known valued of the TNLC cell. In general, the results presented in this paper show that the proposed method provides a reliable means of obtaining the dynamic optical properties of a TNLC cell.

Original languageEnglish
Pages (from-to)10213-10223
Number of pages11
JournalOptics Express
Volume23
Issue number8
DOIs
Publication statusPublished - 2015

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

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