Charge imaging and manipulation using carbon nanotube probes

S. D. Tzeng, Chung-Lin Wu, Y. C. You, T. T. Chen, S. Gwo, H. Tokumoto

Research output: Contribution to journalArticle

23 Citations (Scopus)

Abstract

The use of carbon nanotube (CNT) probes for charge imaging and manipulation was investigated. The local nature of CNT tip for electrostatic force microscopy was demonstrated. Force-distance measurements and tip-shape profiling with a uniformly charged oxide square were performed. Results showed that CNT could be used to probe long-range electrostatic forces with a lateral resolution better than 5 nm.

Original languageEnglish
Pages (from-to)5042-5044
Number of pages3
JournalApplied Physics Letters
Volume81
Issue number26
DOIs
Publication statusPublished - 2002 Dec 23

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manipulators
carbon nanotubes
probes
electrostatics
microscopy
oxides

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Tzeng, S. D., Wu, C-L., You, Y. C., Chen, T. T., Gwo, S., & Tokumoto, H. (2002). Charge imaging and manipulation using carbon nanotube probes. Applied Physics Letters, 81(26), 5042-5044. https://doi.org/10.1063/1.1530377
Tzeng, S. D. ; Wu, Chung-Lin ; You, Y. C. ; Chen, T. T. ; Gwo, S. ; Tokumoto, H. / Charge imaging and manipulation using carbon nanotube probes. In: Applied Physics Letters. 2002 ; Vol. 81, No. 26. pp. 5042-5044.
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Tzeng, SD, Wu, C-L, You, YC, Chen, TT, Gwo, S & Tokumoto, H 2002, 'Charge imaging and manipulation using carbon nanotube probes', Applied Physics Letters, vol. 81, no. 26, pp. 5042-5044. https://doi.org/10.1063/1.1530377

Charge imaging and manipulation using carbon nanotube probes. / Tzeng, S. D.; Wu, Chung-Lin; You, Y. C.; Chen, T. T.; Gwo, S.; Tokumoto, H.

In: Applied Physics Letters, Vol. 81, No. 26, 23.12.2002, p. 5042-5044.

Research output: Contribution to journalArticle

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