Abstract
The use of carbon nanotube (CNT) probes for charge imaging and manipulation was investigated. The local nature of CNT tip for electrostatic force microscopy was demonstrated. Force-distance measurements and tip-shape profiling with a uniformly charged oxide square were performed. Results showed that CNT could be used to probe long-range electrostatic forces with a lateral resolution better than 5 nm.
Original language | English |
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Pages (from-to) | 5042-5044 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 81 |
Issue number | 26 |
DOIs | |
Publication status | Published - 2002 Dec 23 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)