Charge imaging and manipulation using carbon nanotube probes

S. D. Tzeng; C. L. Wu; Y. C. You; T. T. Chen; S. Gwo; H. Tokumoto

doi:10.1063/1.1530377

Charge imaging and manipulation using carbon nanotube probes

S. D. Tzeng, C. L. Wu, Y. C. You, T. T. Chen, S. Gwo, H. Tokumoto

Department of Physics

Research output: Contribution to journal › Article › peer-review

24 Citations (Scopus)

Abstract

The use of carbon nanotube (CNT) probes for charge imaging and manipulation was investigated. The local nature of CNT tip for electrostatic force microscopy was demonstrated. Force-distance measurements and tip-shape profiling with a uniformly charged oxide square were performed. Results showed that CNT could be used to probe long-range electrostatic forces with a lateral resolution better than 5 nm.

Original language	English
Pages (from-to)	5042-5044
Number of pages	3
Journal	Applied Physics Letters
Volume	81
Issue number	26
DOIs	https://doi.org/10.1063/1.1530377
Publication status	Published - 2002 Dec 23

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.1530377

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abstract = "The use of carbon nanotube (CNT) probes for charge imaging and manipulation was investigated. The local nature of CNT tip for electrostatic force microscopy was demonstrated. Force-distance measurements and tip-shape profiling with a uniformly charged oxide square were performed. Results showed that CNT could be used to probe long-range electrostatic forces with a lateral resolution better than 5 nm.",

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AU - Wu, C. L.

AU - You, Y. C.

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AU - Gwo, S.

AU - Tokumoto, H.

PY - 2002/12/23

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Charge imaging and manipulation using carbon nanotube probes

Abstract

All Science Journal Classification (ASJC) codes

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