Charge Trapping Augmented Switchable Sub-band-gap Photoresponse of Zinc-Tin Oxide Thin-Film Transistor

Yang Hsuan Hsiao, Tak Pui Leung, Jeng Ting Li, Li Chung Shih, Jen Sue Chen

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)


In this study, a charge trapping thin-film transistor (TFT) is demonstrated based on a zinc-tin oxide (ZTO) semiconductor channel layer and a stack of AlOx/AZO nanoparticles/SiO2 as the gate dielectrics. This device can be switched from the pristine state to the charge trapping state via the application of a positive gate voltage pulse (VG = 40 V for 1 s). When the TFT is set at the charge trapping state, the dynamic photoresponse (to light in the wavelength of 405 or 635 nm) of drain current gain can be significantly enhanced as compared to that of the device set at the pristine state. As a comparison, the ZTO TFT without the nanoparticulate AZO layer exhibits neither charge trapping nor enhanced photoresponse characteristics. The enhancement in the dynamic photoresponse of the charge trapping TFT is attributed to the increasing number of electrons at the ZTO channel by light-assisted detrapping charges. The methodology used in this study provides a unique approach to achieve photosensitive and photostable duality within a single device.

Original languageEnglish
Pages (from-to)2078-2083
Number of pages6
JournalACS Applied Electronic Materials
Issue number7
Publication statusPublished - 2020 Jul 28

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Electrochemistry


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