TY - GEN
T1 - Classification of partial discharge events in GILBS using discrete wavelet transform and probabilistic neural networks
AU - Su, Ming Shou
AU - Chen, Jiann-Fuh
AU - Chen, Chien Yi
AU - Tai, Cheng-Chi
AU - Lin, Yu Hsun
PY - 2012/12/1
Y1 - 2012/12/1
N2 - This paper proposes an approach to determining classification of partial discharge (PD) events in Gas Insulated Load Break Switches (GILBS). Discrete wavelet transform (DWT) is employed to suppress noises of measured signals by the high-frequency current transformer (HFCT). Three kinds of different defects are designed and placed inside three GILBS individually. For accurately determination of the different defect, feature extraction and statistics analysis of the measured signals are used in the proposed method. Finally, experimental results validate that the proposed approach can effectively discriminate the PD events in GILBS.
AB - This paper proposes an approach to determining classification of partial discharge (PD) events in Gas Insulated Load Break Switches (GILBS). Discrete wavelet transform (DWT) is employed to suppress noises of measured signals by the high-frequency current transformer (HFCT). Three kinds of different defects are designed and placed inside three GILBS individually. For accurately determination of the different defect, feature extraction and statistics analysis of the measured signals are used in the proposed method. Finally, experimental results validate that the proposed approach can effectively discriminate the PD events in GILBS.
UR - http://www.scopus.com/inward/record.url?scp=84874235027&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84874235027&partnerID=8YFLogxK
U2 - 10.1109/CMD.2012.6416314
DO - 10.1109/CMD.2012.6416314
M3 - Conference contribution
AN - SCOPUS:84874235027
SN - 9781467310208
T3 - Proceedings of 2012 IEEE International Conference on Condition Monitoring and Diagnosis, CMD 2012
SP - 963
EP - 966
BT - Proceedings of 2012 IEEE International Conference on Condition Monitoring and Diagnosis, CMD 2012
T2 - 2012 IEEE International Conference on Condition Monitoring and Diagnosis, CMD 2012
Y2 - 23 September 2012 through 27 September 2012
ER -