In this study, concept mapping is used to analyze and measure the patent claims in terms of several assessment criteria, which included claims, hierarchies, links, branches and exemplified embodiments. The weight of each assessment criteria was calculated using entropy theory in order to quantify the knowledge structure of a patent claims and identify differences between patent documents. The use of information entropy theory creates an entropy distribution which allows us to evaluate the level of patent disclosure. This is the first time that entropy weight and concept mapping have been used together in the field of patent analysis. This study asserts that concept mapping is a useful tool for inventors trying to adequately disclose the technical content of their inventions, as use which would increase the likelihood of the patent application being successful. While this study uses concept mapping to analyze the technical content of patent documents, its use as a tool for disclosure would allow inventors to better comprehend and detail the knowledge structure of their invention, thus improving the quality of patent documents. It is worth mentioning that Patent Law requires applicants to meet standards for sufficiency of disclosure, with the aim that any person moderately skilled in the art can implement the invention disclosed in the patent documents.
|Translated title of the contribution||Combining Concept Mapping with Entropy Information to Evaluate the Level of Patent Disclosure|
|Original language||Chinese (Traditional)|
|Number of pages||10|
|Journal||Journal of the Chinese Society of Mechanical Engineers, Transactions of the Chinese Institute of Engineers, Series C/Chung-Kuo Chi Hsueh Kung Ch'eng Hsuebo Pao|
|Publication status||Published - 2018 Apr 1|
All Science Journal Classification (ASJC) codes
- Mechanical Engineering