We report the use of a compact continuous-wave sub-terahertz system for inspection applications, using electronic generation and detection methods. A combination of a Gunn diode emitter, a Schottky diode detector, and a polyethylene Fresnel lens provides line-scan images at 0.2 ms with a data acquisition rate of 512 pointss. Examples of the measurement of NASA's insulating panels and applicability of the technology to other nondestructive testing applications are presented and discussed.
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)