Compact modeling of variation in FinFET SRAM cells

Darsen D. Lu, Chung Hsun Lin, Ali M. Niknejad, Chenming Hu

Research output: Contribution to journalArticlepeer-review

28 Citations (Scopus)

Abstract

Editor's note: FinFET technology is a possible solution to achieve a better power/performance trade-off for SRAM cells. This article provides a comprehensive analysis of the variations in FinFET devices, their impact on SRAM stability, and a statistical design procedure for FinFET SRAM cells.

Original languageEnglish
Article number5432322
Pages (from-to)44-50
Number of pages7
JournalIEEE Design and Test of Computers
Volume27
Issue number2
DOIs
Publication statusPublished - 2010 Mar

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Compact modeling of variation in FinFET SRAM cells'. Together they form a unique fingerprint.

Cite this