Comparing photoluminescence and structural properties of electrochemically deposited Cu2Sn1S3 thin films

Hui Ju Chen, Sheng Wen Fu, Hsuan Ta Wu, Shih Hsiung Wu, Chuan-Feng Shih

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationJSAP-OSA Joint Symposia, JSAP 2013
Publication statusPublished - 2013
EventJSAP-OSA Joint Symposia, JSAP 2013 - Kyoto, Japan
Duration: 2013 Sep 162013 Sep 20

Other

OtherJSAP-OSA Joint Symposia, JSAP 2013
CountryJapan
CityKyoto
Period13-09-1613-09-20

Fingerprint

Structural properties
Photoluminescence
photoluminescence
Thin films
thin films

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Chen, H. J., Fu, S. W., Wu, H. T., Wu, S. H., & Shih, C-F. (2013). Comparing photoluminescence and structural properties of electrochemically deposited Cu2Sn1S3 thin films. In JSAP-OSA Joint Symposia, JSAP 2013
Chen, Hui Ju ; Fu, Sheng Wen ; Wu, Hsuan Ta ; Wu, Shih Hsiung ; Shih, Chuan-Feng. / Comparing photoluminescence and structural properties of electrochemically deposited Cu2Sn1S3 thin films. JSAP-OSA Joint Symposia, JSAP 2013. 2013.
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title = "Comparing photoluminescence and structural properties of electrochemically deposited Cu2Sn1S3 thin films",
author = "Chen, {Hui Ju} and Fu, {Sheng Wen} and Wu, {Hsuan Ta} and Wu, {Shih Hsiung} and Chuan-Feng Shih",
year = "2013",
language = "English",
isbn = "9784863483699",
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Chen, HJ, Fu, SW, Wu, HT, Wu, SH & Shih, C-F 2013, Comparing photoluminescence and structural properties of electrochemically deposited Cu2Sn1S3 thin films. in JSAP-OSA Joint Symposia, JSAP 2013. JSAP-OSA Joint Symposia, JSAP 2013, Kyoto, Japan, 13-09-16.

Comparing photoluminescence and structural properties of electrochemically deposited Cu2Sn1S3 thin films. / Chen, Hui Ju; Fu, Sheng Wen; Wu, Hsuan Ta; Wu, Shih Hsiung; Shih, Chuan-Feng.

JSAP-OSA Joint Symposia, JSAP 2013. 2013.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Comparing photoluminescence and structural properties of electrochemically deposited Cu2Sn1S3 thin films

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AU - Fu, Sheng Wen

AU - Wu, Hsuan Ta

AU - Wu, Shih Hsiung

AU - Shih, Chuan-Feng

PY - 2013

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M3 - Conference contribution

AN - SCOPUS:84898739145

SN - 9784863483699

BT - JSAP-OSA Joint Symposia, JSAP 2013

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