Comparison studies of InGaN epitaxy with trimethylgallium and triethylgallium for photosensors application

Kai Hsuan Lee, Ping Chuan Chang, Shoou Jinn Chang, Yan Kuin Su, San Lein Wu, Manfred Pilkuhn

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

InGaN materials grown by metalorganic chemical vapor deposition (MOCVD) using trimethylgallium (TMG) and triethylgallium (TEG) as alkyl source were compared. Ga-doped ZnO (GZO) films using radio frequency (RF) magnetron sputtering to feature Schottky contacts onto InGaN epitaxial layer with AlN or Mg-doped GaN in-situ capping layer were demonstrated. It is of great potential in application to high performance InGaN photosensors.

Original languageEnglish
Pages (from-to)899-904
Number of pages6
JournalMaterials Chemistry and Physics
Volume134
Issue number2-3
DOIs
Publication statusPublished - 2012 Jun 15

All Science Journal Classification (ASJC) codes

  • General Materials Science
  • Condensed Matter Physics

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