Abstract
InGaN materials grown by metalorganic chemical vapor deposition (MOCVD) using trimethylgallium (TMG) and triethylgallium (TEG) as alkyl source were compared. Ga-doped ZnO (GZO) films using radio frequency (RF) magnetron sputtering to feature Schottky contacts onto InGaN epitaxial layer with AlN or Mg-doped GaN in-situ capping layer were demonstrated. It is of great potential in application to high performance InGaN photosensors.
Original language | English |
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Pages (from-to) | 899-904 |
Number of pages | 6 |
Journal | Materials Chemistry and Physics |
Volume | 134 |
Issue number | 2-3 |
DOIs | |
Publication status | Published - 2012 Jun 15 |
All Science Journal Classification (ASJC) codes
- General Materials Science
- Condensed Matter Physics