Concurrent Error Detection of CMOS Digital and Analog Faults

Y.-R. Shieh, Cheng-Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationEuropean Test Conference (ETC)
Place of PublicationRotterdam
Pages74-81
Publication statusPublished - 1993 Apr

Cite this