| Original language | English |
|---|---|
| Title of host publication | European Test Conference (ETC) |
| Place of Publication | Rotterdam |
| Pages | 74-81 |
| Publication status | Published - 1993 Apr |
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Concurrent Error Detection of CMOS Digital and Analog Faults
Y.-R. Shieh, Cheng-Wen Wu
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution