Concurrent test method for OTA-C filters

Kuen Jong Lee, Kou Shung Huang, Wei Chung Wang, S. Pookaiyaudom, R. Sitdhikorn, A. Thanachayanont

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

A new testable design method for OTA-C filters is presented. By comparing the currents consumed by the circuit under test (CUT) and the currents converted from the voltage levels of the CUT, abnormalities in the function of circuit components can be concurrently detected.

Original languageEnglish
Pages (from-to)1-3
Number of pages3
JournalElectronics Letters
Volume33
Issue number1
DOIs
Publication statusPublished - 1997 Jan 2

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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    Lee, K. J., Huang, K. S., Wang, W. C., Pookaiyaudom, S., Sitdhikorn, R., & Thanachayanont, A. (1997). Concurrent test method for OTA-C filters. Electronics Letters, 33(1), 1-3. https://doi.org/10.1049/el:19970045