Concurrent test method for OTA-C filters

Kuen Jong Lee; Kou Shung Huang; Wei Chung Wang; S. Pookaiyaudom; R. Sitdhikorn; A. Thanachayanont

doi:10.1049/el:19970045

Concurrent test method for OTA-C filters

Kuen Jong Lee, Kou Shung Huang, Wei Chung Wang, S. Pookaiyaudom, R. Sitdhikorn, A. Thanachayanont

Department of Electrical Engineering

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

A new testable design method for OTA-C filters is presented. By comparing the currents consumed by the circuit under test (CUT) and the currents converted from the voltage levels of the CUT, abnormalities in the function of circuit components can be concurrently detected.

Original language	English
Pages (from-to)	1-3
Number of pages	3
Journal	Electronics Letters
Volume	33
Issue number	1
DOIs	https://doi.org/10.1049/el:19970045
Publication status	Published - 1997 Jan 2

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

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10.1049/el:19970045

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title = "Concurrent test method for OTA-C filters",

abstract = "A new testable design method for OTA-C filters is presented. By comparing the currents consumed by the circuit under test (CUT) and the currents converted from the voltage levels of the CUT, abnormalities in the function of circuit components can be concurrently detected.",

author = "Lee, {Kuen Jong} and Huang, {Kou Shung} and Wang, {Wei Chung} and S. Pookaiyaudom and R. Sitdhikorn and A. Thanachayanont",

year = "1997",

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AU - Lee, Kuen Jong

AU - Huang, Kou Shung

AU - Wang, Wei Chung

AU - Pookaiyaudom, S.

AU - Sitdhikorn, R.

AU - Thanachayanont, A.

PY - 1997/1/2

Y1 - 1997/1/2

N2 - A new testable design method for OTA-C filters is presented. By comparing the currents consumed by the circuit under test (CUT) and the currents converted from the voltage levels of the CUT, abnormalities in the function of circuit components can be concurrently detected.

AB - A new testable design method for OTA-C filters is presented. By comparing the currents consumed by the circuit under test (CUT) and the currents converted from the voltage levels of the CUT, abnormalities in the function of circuit components can be concurrently detected.

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DO - 10.1049/el:19970045

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VL - 33

SP - 1

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JO - Electronics Letters

JF - Electronics Letters

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ER -

Concurrent test method for OTA-C filters

Abstract

All Science Journal Classification (ASJC) codes

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