TY - GEN
T1 - Continuous-conduction-mode charge-pump power-factor-correction electronic ballast with DC-bus voltage stress reduction function
AU - Lin, Ray-Lee
AU - Chen, Yen Yu
PY - 2010/12/1
Y1 - 2010/12/1
N2 - This paper presents the continuous-conduction-mode charge-pump power-factor-correction (CCM CP-PFC) electronic ballast with DC-bus voltage stress reduction function. The CP-PFC techniques are widely applied to the electronic ballasts in order to achieve high power factor. However, the DC-bus voltage at preheat or ignition mode is higher than that at steady-state operation, which causes high voltage stresses on the active and passive components. Therefore, the input notch filter for the CCM CP-PFC electronic ballast is proposed in order to reduce the DC-bus voltage stress at preheat and ignition modes. Furthermore, to achieve high power factor functionality, the design guidelines for the CCM voltage-source (VS) CP-PFC electronic ballast is presented. Finally, one prototype circuit of the CCM VS CP-PFC electronic ballast for one T5-54W fluorescent lamp is built to verify the performance of the PFC and the voltage-stress reduction capability of the DC-bus.
AB - This paper presents the continuous-conduction-mode charge-pump power-factor-correction (CCM CP-PFC) electronic ballast with DC-bus voltage stress reduction function. The CP-PFC techniques are widely applied to the electronic ballasts in order to achieve high power factor. However, the DC-bus voltage at preheat or ignition mode is higher than that at steady-state operation, which causes high voltage stresses on the active and passive components. Therefore, the input notch filter for the CCM CP-PFC electronic ballast is proposed in order to reduce the DC-bus voltage stress at preheat and ignition modes. Furthermore, to achieve high power factor functionality, the design guidelines for the CCM voltage-source (VS) CP-PFC electronic ballast is presented. Finally, one prototype circuit of the CCM VS CP-PFC electronic ballast for one T5-54W fluorescent lamp is built to verify the performance of the PFC and the voltage-stress reduction capability of the DC-bus.
UR - http://www.scopus.com/inward/record.url?scp=78751496690&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=78751496690&partnerID=8YFLogxK
U2 - 10.1109/IECON.2010.5675146
DO - 10.1109/IECON.2010.5675146
M3 - Conference contribution
AN - SCOPUS:78751496690
SN - 9781424452262
T3 - IECON Proceedings (Industrial Electronics Conference)
SP - 2547
EP - 2552
BT - Proceedings - IECON 2010, 36th Annual Conference of the IEEE Industrial Electronics Society
T2 - 36th Annual Conference of the IEEE Industrial Electronics Society, IECON 2010
Y2 - 7 November 2010 through 10 November 2010
ER -