Continuous-conduction-mode charge-pump power-factor-correction electronic ballast with DC-bus voltage stress reduction function

Ray-Lee Lin, Yen Yu Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents the continuous-conduction-mode charge-pump power-factor-correction (CCM CP-PFC) electronic ballast with DC-bus voltage stress reduction function. The CP-PFC techniques are widely applied to the electronic ballasts in order to achieve high power factor. However, the DC-bus voltage at preheat or ignition mode is higher than that at steady-state operation, which causes high voltage stresses on the active and passive components. Therefore, the input notch filter for the CCM CP-PFC electronic ballast is proposed in order to reduce the DC-bus voltage stress at preheat and ignition modes. Furthermore, to achieve high power factor functionality, the design guidelines for the CCM voltage-source (VS) CP-PFC electronic ballast is presented. Finally, one prototype circuit of the CCM VS CP-PFC electronic ballast for one T5-54W fluorescent lamp is built to verify the performance of the PFC and the voltage-stress reduction capability of the DC-bus.

Original languageEnglish
Title of host publicationProceedings - IECON 2010, 36th Annual Conference of the IEEE Industrial Electronics Society
Pages2547-2552
Number of pages6
DOIs
Publication statusPublished - 2010
Event36th Annual Conference of the IEEE Industrial Electronics Society, IECON 2010 - Glendale, AZ, United States
Duration: 2010 Nov 72010 Nov 10

Other

Other36th Annual Conference of the IEEE Industrial Electronics Society, IECON 2010
CountryUnited States
CityGlendale, AZ
Period10-11-0710-11-10

Fingerprint

Pumps
Electric potential
Ignition
Fluorescent lamps
Notch filters
Networks (circuits)

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

Cite this

Lin, R-L., & Chen, Y. Y. (2010). Continuous-conduction-mode charge-pump power-factor-correction electronic ballast with DC-bus voltage stress reduction function. In Proceedings - IECON 2010, 36th Annual Conference of the IEEE Industrial Electronics Society (pp. 2547-2552). [5675146] https://doi.org/10.1109/IECON.2010.5675146
Lin, Ray-Lee ; Chen, Yen Yu. / Continuous-conduction-mode charge-pump power-factor-correction electronic ballast with DC-bus voltage stress reduction function. Proceedings - IECON 2010, 36th Annual Conference of the IEEE Industrial Electronics Society. 2010. pp. 2547-2552
@inproceedings{1633adc74ea24ee4bacc6154680f3c41,
title = "Continuous-conduction-mode charge-pump power-factor-correction electronic ballast with DC-bus voltage stress reduction function",
abstract = "This paper presents the continuous-conduction-mode charge-pump power-factor-correction (CCM CP-PFC) electronic ballast with DC-bus voltage stress reduction function. The CP-PFC techniques are widely applied to the electronic ballasts in order to achieve high power factor. However, the DC-bus voltage at preheat or ignition mode is higher than that at steady-state operation, which causes high voltage stresses on the active and passive components. Therefore, the input notch filter for the CCM CP-PFC electronic ballast is proposed in order to reduce the DC-bus voltage stress at preheat and ignition modes. Furthermore, to achieve high power factor functionality, the design guidelines for the CCM voltage-source (VS) CP-PFC electronic ballast is presented. Finally, one prototype circuit of the CCM VS CP-PFC electronic ballast for one T5-54W fluorescent lamp is built to verify the performance of the PFC and the voltage-stress reduction capability of the DC-bus.",
author = "Ray-Lee Lin and Chen, {Yen Yu}",
year = "2010",
doi = "10.1109/IECON.2010.5675146",
language = "English",
isbn = "9781424452262",
pages = "2547--2552",
booktitle = "Proceedings - IECON 2010, 36th Annual Conference of the IEEE Industrial Electronics Society",

}

Lin, R-L & Chen, YY 2010, Continuous-conduction-mode charge-pump power-factor-correction electronic ballast with DC-bus voltage stress reduction function. in Proceedings - IECON 2010, 36th Annual Conference of the IEEE Industrial Electronics Society., 5675146, pp. 2547-2552, 36th Annual Conference of the IEEE Industrial Electronics Society, IECON 2010, Glendale, AZ, United States, 10-11-07. https://doi.org/10.1109/IECON.2010.5675146

Continuous-conduction-mode charge-pump power-factor-correction electronic ballast with DC-bus voltage stress reduction function. / Lin, Ray-Lee; Chen, Yen Yu.

Proceedings - IECON 2010, 36th Annual Conference of the IEEE Industrial Electronics Society. 2010. p. 2547-2552 5675146.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Continuous-conduction-mode charge-pump power-factor-correction electronic ballast with DC-bus voltage stress reduction function

AU - Lin, Ray-Lee

AU - Chen, Yen Yu

PY - 2010

Y1 - 2010

N2 - This paper presents the continuous-conduction-mode charge-pump power-factor-correction (CCM CP-PFC) electronic ballast with DC-bus voltage stress reduction function. The CP-PFC techniques are widely applied to the electronic ballasts in order to achieve high power factor. However, the DC-bus voltage at preheat or ignition mode is higher than that at steady-state operation, which causes high voltage stresses on the active and passive components. Therefore, the input notch filter for the CCM CP-PFC electronic ballast is proposed in order to reduce the DC-bus voltage stress at preheat and ignition modes. Furthermore, to achieve high power factor functionality, the design guidelines for the CCM voltage-source (VS) CP-PFC electronic ballast is presented. Finally, one prototype circuit of the CCM VS CP-PFC electronic ballast for one T5-54W fluorescent lamp is built to verify the performance of the PFC and the voltage-stress reduction capability of the DC-bus.

AB - This paper presents the continuous-conduction-mode charge-pump power-factor-correction (CCM CP-PFC) electronic ballast with DC-bus voltage stress reduction function. The CP-PFC techniques are widely applied to the electronic ballasts in order to achieve high power factor. However, the DC-bus voltage at preheat or ignition mode is higher than that at steady-state operation, which causes high voltage stresses on the active and passive components. Therefore, the input notch filter for the CCM CP-PFC electronic ballast is proposed in order to reduce the DC-bus voltage stress at preheat and ignition modes. Furthermore, to achieve high power factor functionality, the design guidelines for the CCM voltage-source (VS) CP-PFC electronic ballast is presented. Finally, one prototype circuit of the CCM VS CP-PFC electronic ballast for one T5-54W fluorescent lamp is built to verify the performance of the PFC and the voltage-stress reduction capability of the DC-bus.

UR - http://www.scopus.com/inward/record.url?scp=78751496690&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=78751496690&partnerID=8YFLogxK

U2 - 10.1109/IECON.2010.5675146

DO - 10.1109/IECON.2010.5675146

M3 - Conference contribution

SN - 9781424452262

SP - 2547

EP - 2552

BT - Proceedings - IECON 2010, 36th Annual Conference of the IEEE Industrial Electronics Society

ER -

Lin R-L, Chen YY. Continuous-conduction-mode charge-pump power-factor-correction electronic ballast with DC-bus voltage stress reduction function. In Proceedings - IECON 2010, 36th Annual Conference of the IEEE Industrial Electronics Society. 2010. p. 2547-2552. 5675146 https://doi.org/10.1109/IECON.2010.5675146