Control and observation structures for analog circuits

Yeong Ruey Shieh; Cheng Wen Wu

doi:10.1109/54.679208

Control and observation structures for analog circuits

Yeong Ruey Shieh, Cheng Wen Wu

Department of Electrical Engineering

Research output: Contribution to journal › Review article › peer-review

13 Citations (Scopus)

Abstract

No previously proposed analog built-in self-test method allows simultaneous control of all test points, the basic diagnosis capability required for analog circuits. Here is an approach that allows observation and control of DC voltage levels of all test points simultaneously, with a calibration process that ensures accuracy.

Original language	English
Pages (from-to)	56-64
Number of pages	9
Journal	IEEE Design and Test of Computers
Volume	15
Issue number	2
DOIs	https://doi.org/10.1109/54.679208
Publication status	Published - 1998 Apr 1

All Science Journal Classification (ASJC) codes

Hardware and Architecture

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10.1109/54.679208

Cite this

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title = "Control and observation structures for analog circuits",

abstract = "No previously proposed analog built-in self-test method allows simultaneous control of all test points, the basic diagnosis capability required for analog circuits. Here is an approach that allows observation and control of DC voltage levels of all test points simultaneously, with a calibration process that ensures accuracy.",

author = "Shieh, {Yeong Ruey} and Wu, {Cheng Wen}",

note = "Funding Information: The National Science Council, Taiwan, under contracts NSC87-2215-E007-010 and NSC87-2215-E007-018, partly supported this work.",

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AU - Shieh, Yeong Ruey

AU - Wu, Cheng Wen

N1 - Funding Information: The National Science Council, Taiwan, under contracts NSC87-2215-E007-010 and NSC87-2215-E007-018, partly supported this work.

PY - 1998/4/1

Y1 - 1998/4/1

N2 - No previously proposed analog built-in self-test method allows simultaneous control of all test points, the basic diagnosis capability required for analog circuits. Here is an approach that allows observation and control of DC voltage levels of all test points simultaneously, with a calibration process that ensures accuracy.

AB - No previously proposed analog built-in self-test method allows simultaneous control of all test points, the basic diagnosis capability required for analog circuits. Here is an approach that allows observation and control of DC voltage levels of all test points simultaneously, with a calibration process that ensures accuracy.

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Control and observation structures for analog circuits

Abstract

All Science Journal Classification (ASJC) codes

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