Control and observation structures for analog circuits

Yeong Ruey Shieh, Cheng Wen Wu

Research output: Contribution to journalReview article

13 Citations (Scopus)

Abstract

No previously proposed analog built-in self-test method allows simultaneous control of all test points, the basic diagnosis capability required for analog circuits. Here is an approach that allows observation and control of DC voltage levels of all test points simultaneously, with a calibration process that ensures accuracy.

Original languageEnglish
Pages (from-to)56-64
Number of pages9
JournalIEEE Design and Test of Computers
Volume15
Issue number2
DOIs
Publication statusPublished - 1998 Apr 1

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture

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