Coordinated electrical characterization system for photovoltaic devices

Jian V. Li, Jerry Tynan, Hao Chih Yuan, Qi Wang, David S. Albin, Xiaonan Li, Dean H. Levi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report the development of a coordinated electrical characterization station integrating the data collection and analysis of a wide variety of DC, AC, and transient measurements. The DC current-voltage measurements consider the overall carrier-transport characteristics and cell performance. The AC measurements (e.g., capacitance-voltage, admittance spectroscopy, drive-level capacitance profiling) provide information regarding the spatial distribution and exchange of charge carriers with traps. The transient measurements (e.g., open-circuit voltage decay) investigate the lifetime and recombination of non-equilibrium carriers in a cell. We demonstrate that a coordinated characterization including the DC, AC, and transient measurements may generate new insight and unique understanding of the photovoltaic device. Using the equivalent-circuit parameters determined from the coordinated characterization set, we simulated the decay behavior of the open-circuit voltage in a crystalline silicon solar cell and found good agreement with experiment. The coordinated electrical characterization of CdTe thin-film solar cells not only avoided a misinterpretation of the admittance spectroscopy data, but also provided information to estimate the electrically active thickness, photoconductivity, and mobility of the CdTe absorber.

Original languageEnglish
Title of host publicationProgram - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010
Pages1749-1752
Number of pages4
DOIs
Publication statusPublished - 2010 Dec 20
Event35th IEEE Photovoltaic Specialists Conference, PVSC 2010 - Honolulu, HI, United States
Duration: 2010 Jun 202010 Jun 25

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Other

Other35th IEEE Photovoltaic Specialists Conference, PVSC 2010
CountryUnited States
CityHonolulu, HI
Period10-06-2010-06-25

Fingerprint

Open circuit voltage
Spectroscopy
Capacitance measurement
Carrier transport
Silicon solar cells
Voltage measurement
Photoconductivity
Electric current measurement
Charge carriers
Equivalent circuits
Spatial distribution
Capacitance
Crystalline materials
Electric potential
Experiments
Thin film solar cells

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

Cite this

Li, J. V., Tynan, J., Yuan, H. C., Wang, Q., Albin, D. S., Li, X., & Levi, D. H. (2010). Coordinated electrical characterization system for photovoltaic devices. In Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010 (pp. 1749-1752). [5615863] (Conference Record of the IEEE Photovoltaic Specialists Conference). https://doi.org/10.1109/PVSC.2010.5615863
Li, Jian V. ; Tynan, Jerry ; Yuan, Hao Chih ; Wang, Qi ; Albin, David S. ; Li, Xiaonan ; Levi, Dean H. / Coordinated electrical characterization system for photovoltaic devices. Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010. 2010. pp. 1749-1752 (Conference Record of the IEEE Photovoltaic Specialists Conference).
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Li, JV, Tynan, J, Yuan, HC, Wang, Q, Albin, DS, Li, X & Levi, DH 2010, Coordinated electrical characterization system for photovoltaic devices. in Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010., 5615863, Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 1749-1752, 35th IEEE Photovoltaic Specialists Conference, PVSC 2010, Honolulu, HI, United States, 10-06-20. https://doi.org/10.1109/PVSC.2010.5615863

Coordinated electrical characterization system for photovoltaic devices. / Li, Jian V.; Tynan, Jerry; Yuan, Hao Chih; Wang, Qi; Albin, David S.; Li, Xiaonan; Levi, Dean H.

Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010. 2010. p. 1749-1752 5615863 (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Li JV, Tynan J, Yuan HC, Wang Q, Albin DS, Li X et al. Coordinated electrical characterization system for photovoltaic devices. In Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010. 2010. p. 1749-1752. 5615863. (Conference Record of the IEEE Photovoltaic Specialists Conference). https://doi.org/10.1109/PVSC.2010.5615863