Core-based system-on-chip testing: Challenges and opportunities

Cheng-Wen Wu, C.-T. Huang, J.-F. Li

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)
Original languageEnglish
Pages (from-to)335-353
JournalJournal of Chinese Institute of Electrical Engineering
Volume8
Issue number4
Publication statusPublished - 2001 Nov

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