| Original language | English |
|---|---|
| Pages (from-to) | 335-353 |
| Journal | Journal of Chinese Institute of Electrical Engineering |
| Volume | 8 |
| Issue number | 4 |
| Publication status | Published - 2001 Nov |
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Core-based system-on-chip testing: Challenges and opportunities
- Cheng-Wen Wu
- , C.-T. Huang
- , J.-F. Li
Research output: Contribution to journal › Article › peer-review
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