Fingerprint
Dive into the research topics of 'Correlation between random telegraph noise and 1/f noise parameters in 28-nm pMOSFETs with tip-shaped SiGe source/drain'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Correlation between random telegraph noise and 1/f noise parameters in 28-nm pMOSFETs with tip-shaped SiGe source/drain
Bo Chin Wang, San Lein Wu, Chien Wei Huang, Yu Ying Lu, Shoou Jinn Chang, Yu Min Lin, Kun Hsien Lee, Osbert Cheng
Research output: Contribution to journal › Article › peer-review
12
Citations
(Scopus)