We present cost and benefit models and analyze the economics effects of built-in self-test (BIST) for logic and memory cores. In our cost and benefit models for BIST, we take into consideration the design verification time and test development time associated with testability. Experimental results for logic BIST and memory BIST examples show that a threshold volume exists when BIST is profitable for the logic core under consideration - it is not recommended for a higher volume. However, BIST is a good choice for memory cores in general.
|Number of pages||5|
|Journal||Proceedings -Design, Automation and Test in Europe, DATE|
|Publication status||Published - 2000 Dec 1|
|Event||Design, Automation and Test in Europe Conference and Exhibition 2000, DATE 2000 - Paris, France|
Duration: 2000 Mar 27 → 2000 Mar 30
All Science Journal Classification (ASJC) codes