TY - GEN
T1 - Credit rating analysis with support vector machines and artificial bee colony algorithm
AU - Chen, Mu Yen
AU - Chen, Chia Chen
AU - Liu, Jia Yu
N1 - Copyright:
Copyright 2013 Elsevier B.V., All rights reserved.
PY - 2013
Y1 - 2013
N2 - Recently, credit rating analysis for financial engineering has attracted many research attentions. In the previous, statistical and artificial intelligent methods for credit rating have been widely investigated. Most of them, they focus on the hybrid models by integrating many artificial intelligent methods have proven outstanding performances. This research proposes a newly hybrid evolution algorithm to integrate artificial bee colony (ABC) with the support vector machine (SVM) to predict the corporate credit rating problems. The experiment dataset are select from 2001 to 2008 of Compustat credit rating database in America. The empirical results show the ABC-SVM model has the highest classification accuracy. Hence, this research presents the ABC-SVM model could be better suited for predicting the credit rating.
AB - Recently, credit rating analysis for financial engineering has attracted many research attentions. In the previous, statistical and artificial intelligent methods for credit rating have been widely investigated. Most of them, they focus on the hybrid models by integrating many artificial intelligent methods have proven outstanding performances. This research proposes a newly hybrid evolution algorithm to integrate artificial bee colony (ABC) with the support vector machine (SVM) to predict the corporate credit rating problems. The experiment dataset are select from 2001 to 2008 of Compustat credit rating database in America. The empirical results show the ABC-SVM model has the highest classification accuracy. Hence, this research presents the ABC-SVM model could be better suited for predicting the credit rating.
UR - http://www.scopus.com/inward/record.url?scp=84881378651&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84881378651&partnerID=8YFLogxK
U2 - 10.1007/978-3-642-38577-3_54
DO - 10.1007/978-3-642-38577-3_54
M3 - Conference contribution
AN - SCOPUS:84881378651
SN - 9783642385766
T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
SP - 528
EP - 534
BT - Recent Trends in Applied Artificial Intelligence - 26th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2013, Proceedings
T2 - 26th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2013
Y2 - 17 June 2013 through 21 June 2013
ER -