Crystallization behavior and dielectric properties of a new high dielectric constant low-temperature cofired ceramics material based on Nd 2O3-TiO2-SiO2 glass-ceramics

Hsing I. Hsiang, Li Then Mei, Wen Chang Liao, Fu Su Yen

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3 Citations (Scopus)

Abstract

The crystallization and sintering behaviors of glass-ceramics (Nd 2O3-TiO2-SiO2) have been investigated using the differential thermal analyzer, thermal mechanical analyzer, X-ray diffractometer, scanning electron microscopy, and transmission electron microscopy. The results showed that the onset of glass shrinkage occurred at around the glass transition temperature (Tg=708°C). The first crystalline phase, Nd2Ti4O11, was observed at around 775°C. Fully densified NdTiSi glass can be obtained via glass viscous flow before the second crystalline phase, Nd 0.66TiO3, occurring at about 850°C. The as-prepared NdTiSi glass-ceramics sintered at 900°C exhibited a high dielectric constant of 23 and a quality factor of about 600, which provided a promising candidate for low-temperature cofired ceramics applications.

Original languageEnglish
Pages (from-to)1714-1717
Number of pages4
JournalJournal of the American Ceramic Society
Volume93
Issue number6
DOIs
Publication statusPublished - 2010 Jun

All Science Journal Classification (ASJC) codes

  • Ceramics and Composites
  • Materials Chemistry

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