DC and 1/f noise characteristics of strained-Si nMOSFETs using chemical-mechanical-polishing technique

Hau Yu Lin, San Lein Wu, Shoou-Jinn Chang, Cheng Wen Kuo, Yen Ping Wang, Shang Chao Hung

Research output: Contribution to journalArticle

1 Citation (Scopus)

Fingerprint Dive into the research topics of 'DC and 1/f noise characteristics of strained-Si nMOSFETs using chemical-mechanical-polishing technique'. Together they form a unique fingerprint.

Physics & Astronomy

Chemical Compounds

Engineering & Materials Science