The superradiant decay rate and renormalized frequency shift of Wannier excitons in a semiconductor film of N layers are studied. It is found that both the decay rate and renormalized frequency shift show oscillatory dependence on layer thickness. The crossover from the superradiant exciton to the bulk polariton when varying N from 1 to (Formula presented) is also examined.
|Number of pages||5|
|Journal||Physical Review B - Condensed Matter and Materials Physics|
|Publication status||Published - 2000 Jan 1|
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics